BS ISO 18118:2015 pdf free.Surface chemical analysis – Auger electron spectroscopy and X-ray photoelectron spectroscopy一Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials. BS ISO 18118 gives guidance on the measurement and use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials by Auger electron spectroscopy and X-ray photoelectron spectroscopy. 2 Normative references The following documents, in whole or in part, are normatively referenced in this document and are indispensable for its application. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 18115, Surface chemical analysis — Vocabulary ISO 21270, Surface chemical analysis — X-ray photoelectron andAuger electron spectrometers — Linearity of intensity scale 3 Terms and definitions For the purposes of this document, the terms and definitions given in ISO 18115 and the following apply. absolute elemental sensitivity factor coefficient for an element by which the measured intensity for that element is divided to yield the atomic concentration or atomic fraction of the element present in the sample Note ito entry: The choice of use of atomic concentration or atomic fraction should be…